Study of MgO (111) Charging Phenomena Using Scanning Electron Microscopy and Atomic Force Microscopy

In this article we have studied, using the Scanning Electron Microscopy SEM LEO 440, the surface electrical properties of MgO (111) irradiated with 30 keV electrons. The study of the evolution of the secondary electronic emission of MgO (111) shows that \(\ln \sigma \) increases and reaches a value lower than zero. After an injection of 5000 pC, we observe a pseudo mirror, which is due to a very negative surface potential. Finally, we have shown the very high stability of charges within MgO (111) thanks to the use of Atomic Force Microscopy coupled with Scanning Electron Microscope. We can then conclude that MgO (111) is a good trapping insulator.