Thermal Dynamics of 7 nm FinFET Process Cascode Cross Coupled Double Tail Dynamic Comparator for Future Analog to Digital Converters
摘要
The adoption of dynamic regenerative voltage comparators is being driven by the demand for ultra-high speed, area-efficient, and extremely low-power ADCs in order to maximise power efficiency and conversion speed. In this work, thermal dynamics of a 7 nm FinFET process based cascode cross coupled double tail comparator have been investigated for future ADCs. The cascode cross coupled double tail comparator exhibited thermal-inversion effects (TIE) at 7 nm technology at all operating voltages. When the operating temperature (T) was raised from 27 to 107°C, the cross coupled double tail cascode dynamic-voltage-comparator (DVC) simulated with 0.7 V exhibited a 16.44% decrease in delay and 47.43% increase in power. When ΔVIN was elevated from 0.1 to 0.7 V at 27°C, the cross coupled double tail cascode DVC exhibited a 7.04% decrease in delay and an 11.11% decrease in power. The influence of T on the short circuit power of a 7 nm FinFET process based cascode cross coupled double tail comparator has also been investigated.