Textured CdTe Thin Films on Silicon and Sapphire Substrates: Thermal Vapor Deposition and Structural Characterization

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发表日期：

2024年4月1日

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I. O. Koshelev,
I. S. Volchkov,
P. L. Podkur,
D. R. Khairetdinova,
I. M. Doludenko,
V. M. Kanevsky

摘要

Abstract

CdTe thin films were grown on Si(111) and Al₂O₃(0001) substrates by thermal vapor deposition. The obtained films were studied by atomic-force and scanning electron microscopy, as well as by X-ray diffraction analysis. It was found that thin films of both wurtzite and sphalerite CdTe modifications can be grown on Al₂O₃(0001) substrates. Thin films of the sphalerite CdTe modification can be obtained on Si substrates. It was shown that the elemental composition of thin films is close to stoichiometry, and, in the case of thin films grown on Al₂O₃(0001), the deviation was no more than 1 at %.