Modeling of Impurity Gettering in Silicon
摘要
Abstract
The influence of the gettering process on the efficiency of heterojunction photovoltaic converters depending on the content of fast-diffusing transition metal impurities are numerically modeled. The data obtained are correlated with modifications in the silicate glass structure intentionally doped with Ni ions and with a Fe–Ni pair of ions, identified by the analysis of Raman spectra.