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Abstract <p>Thin ferroelectric films of Ba<sub>0.5</sub>Sr<sub>0.5</sub>TiO<sub>3,</sub> grown on various substrates (Sp, LaAlO<sub>3</sub> polycor) using Rf spattering technology, were studied using spectroscopic methods (IR absorption, Raman scattering, second harmonic generation). The actual properties of these films (thickness, rate of grows temperature dependence of order parameter e.a.) were obtained.</p>

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Spectroscopic Investigations of Dipole Moment in BaSrTiO3 Thin Films

  • 期刊论文

  • 发表日期：

    2025年12月1日

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  • A. M. Pugachev,
  • A. V. Tumarkin

摘要

Abstract

Thin ferroelectric films of Ba0.5Sr0.5TiO3, grown on various substrates (Sp, LaAlO3 polycor) using Rf spattering technology, were studied using spectroscopic methods (IR absorption, Raman scattering, second harmonic generation). The actual properties of these films (thickness, rate of grows temperature dependence of order parameter e.a.) were obtained.