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Selection of Internal Standards for Determining Rare-Earth Elements by Microwave Induced Plasma Optical Emission Spectrometry

  • P. V. Kim,
  • E. V. Polyakova,
  • R. E. Nikolaev

摘要

Abstract

Microwave plasma atomic emission spectrometry is used to determine the composition of lanthanum sulfide and europium-doped gadolinium oxide crystals, and also of elements in the melt (tin, boron, and lithium). Calibration dependencies for rare-earth elements were found to be nonlinear and did not meet the required accuracy. The internal standard method was used to minimize errors and linearize calibration dependences. Molecular species N2, \({\text{N}}_{2}^{ + }\) , and OH did not affect plasma conditions or interelement influences. Internal standards were selected based on the proximity of their first ionization potential to that of the analytes; Ba, Al, Ga, and In were considered. Using these elements as internal standards enabled the linearization of the calibration dependences, achieving an recovery of 95–105%. The determined total mass of elements was 97–103% of the sample weight, with accuracy confirmed by the standard addition method.