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<p>An Erratum to this paper has been published: https://doi.org/10.1134/S102833582501001X</p>

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Erratum to: Interface Trap-Induced Impact in Linearity and Small-Signal Performance of InAs-Channel TFETs: Reliability Implications

  • 期刊论文

  • 发表日期：

    2025年12月1日

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  • Vedvrat,
  • Rajeev Kumar Sachan

摘要

An Erratum to this paper has been published: https://doi.org/10.1134/S102833582501001X