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Abstract <p>Over the last few decades, high-resolution X-ray imaging recorded with the X-ray phase-absorption ptychography and coherent diffraction microtomography techniques has become an effective tool for investigating nanoscale structures and crystal-lattice defects. Both methods provide lensless high-resolution X-ray imaging and are a powerful alternative to X-ray lens optics. Here, one reports novel achievements in decoding the crystal-lattice defects by computer X-ray diffraction microtomography.</p>

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Contemporary Phase and Achievements of the X-ray Computer Diffraction Microtomography

  • 期刊论文

  • 发表日期：

    2025年4月1日

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  • F. N. Chukhovskii,
  • P. V. Konarev,
  • V. V. Volkov

摘要

Abstract

Over the last few decades, high-resolution X-ray imaging recorded with the X-ray phase-absorption ptychography and coherent diffraction microtomography techniques has become an effective tool for investigating nanoscale structures and crystal-lattice defects. Both methods provide lensless high-resolution X-ray imaging and are a powerful alternative to X-ray lens optics. Here, one reports novel achievements in decoding the crystal-lattice defects by computer X-ray diffraction microtomography.