Variability of NBS-LRR Resistance Genes in Durum Wheat Cultivars Inferred from NBS-Profiling
摘要
One of the most important trends in the development of new durum wheat cultivars is resistance to diseases and pests, causing significant yield losses. The most common class of plant resistance genes is NBS-LRR genes; for the analysis of variability of these genes, the NBS-profiling method is effectively used. In the present work, this method was used for the first time to study domestic durum wheat cultivars and to compare them with foreign cultivars. The detected polymorphism of NBS-LRR resistance genes was rather high (64.04%): 62.12% for 54 Russian cultivars and 36.33% for 21 foreign cultivars. Unique NBS fragments were identified in four spring and three winter cultivars. NBS-profiling data analysis revealed differentiation of Russian and foreign durum wheat cultivars, both spring and winter, which indicates differences in their sets of resistance genes. At the same time, no division by pedigrees and breeding centers was revealed among Russian cultivars.