Evolution of Grain Boundaries in Aluminum during Isothermal Annealing
摘要
Abstract
Electron backscatter diffraction is used to perform in situ investigation of grain boundary behavior during isothermal annealing of textured aluminum foils. Homogeneity of the microstructure in space and continuity of its change in time during grain growth are shown not to exist. The experimentally detected lattice rotation near a grain boundary at a thermal groove can exert a retarding effect on the boundary motion.