Use of the Nanogate‑38 Camera for Beam Diagnostics at the VEPP‑2000 Collider
摘要
Abstract
The Nanogate‑38 gated camera was used to measure the transverse beam dimensions in the BEP booster of the VEPP‑2000 electron−positron collider. The camera is used to measure the vertical beam size by a double-slit interferometer and to visualize a transverse beam profile in single-turn mode with the projection optics. The purpose of the experiments is to assess the applicability of the camera to measurements of the transverse beam dimensions and beam emittance in accelerator experiments at the SKIF synchrotron-radiation source.