Development and Research of a System for Measuring the Distribution of Surface Beta-Radiation Yield of a Flat Source

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发表日期：

2024年8月1日

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S. G. Novikov,
A. V. Berintsev,
A. S. Alekseev,
A. V. Zhukov,
R. A. Kuznetsov,
K. S. Bobrovskaya,
A. A. Chertoriiskii,
V. V. Prikhod’ko

摘要

Abstract—

A system for measuring the spatial distribution of the of beta radiation flux from the radiation source surface has been developed and studied. The principal element of the measuring system is a probe sensor based on scintillation optical fiber, the output optical signal from which is fed to the input of the photon counter and further processed by a microcontroller. Using the numerical modeling method and the Geant4 software libraries, the sensitivity parameters of the sensor element were calculated for the process of measuring the beta radiation flux from the surface of a 63Ni based flat source. The spatial distribution of the yield of beta electrons from a 1 × 1 cm² source and the dependence of the sensitivity of the probe on the distance to the source were experimentally studied. The experimental data are in good agreement with the results of the model calculation.