Transmission Line Pulse Setup for Electrostatic Discharge Robustness Testing of the Semiconductor Devices

An original transmission line pulse setup has been presented. This test setup allows to measure quasi-static I–V curves of the semiconductor devices and electrostatic discharge protection and investigate the electrostatic discharge robustness of the integrated circuits. The setup allows to perform both destructive and nondestructive tests. The designed test setup allows to perform transmission line pulse test using 100 ns pulse with current peak value up to 10 A according to the IEC62615 international standard.