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Emergence of exchange bias in van der Waals magnetic alloy CrxPt1−xTe2

  • Ryan Bailey-Crandell,
  • Warren L. B. Huey,
  • Archibald J. Williams,
  • Wenyi Zhou,
  • Joshua E. Goldberger,
  • Roland K. Kawakami

摘要

CrxPt1−xTe2 is a recently developed van der Waals magnetic alloy noted for its stability under ambient conditions. Here, we report the emergence of an exchange bias effect in CrxPt1−xTe2, without typical exchange bias sources such as an adjacent antiferromagnetic layer. We find that the exchange bias is present for x = 0.45 and absent for x = 0.35, which is correlated to the presence of a Cr modulation where the Cr concentration alternates each vdW layer (modulation period of 2 layers) for x ≥ 0.4. We perform Monte Carlo simulations utilizing exchange parameters from first-principles calculations, which recreate the exchange bias in hysteresis loops of Cr0.45Pt0.55Te2. From our simulations, we infer the source of exchange bias to be magnetic moments locked into free energy minima that resist magnetization reversal. This work presents a way to introduce desirable magnetic properties to van der Waals magnets.