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<p>Uncovering structural information of biological systems at the nanoscale is vital for understanding their dynamics and function. Nanoscale imaging techniques that obtain structural information down to the single-molecule level under physiologically relevant conditions and without affecting the fragile structure of biomaterials are limited. Thus, the realization of such techniques is highly attractive, especially within the biological sciences. Nanopipette-based imaging using scanning ion conductance microscopy (SICM) fulfills these requirements, but resolution limitations and artefact formation hinder obtaining accurate structural information on the scale comparable to the pipette tip. Here, we present a novel technique, super-resolution SICM (SR-SICM), based on image deconvolution using simulated pipette point-spread functions. The technique is demonstrated on different types of nanostructures, where it surpasses the lateral resolution limit of SICM and mitigates imaging artefacts considerably. SR-SICM is applicable to any SICM dataset through user-friendly downloadable software promoting the possibility of single-molecule studies on a routine basis.</p><p></p>

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Super-resolution imaging with nanopipettes

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2025年9月22日

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  • Steffan Møller Sønderskov,
  • Lasse Hyldgaard Klausen,
  • Sebastian Amland Skaanvik,
  • Xiaojun Han,
  • Mingdong Dong

摘要

Uncovering structural information of biological systems at the nanoscale is vital for understanding their dynamics and function. Nanoscale imaging techniques that obtain structural information down to the single-molecule level under physiologically relevant conditions and without affecting the fragile structure of biomaterials are limited. Thus, the realization of such techniques is highly attractive, especially within the biological sciences. Nanopipette-based imaging using scanning ion conductance microscopy (SICM) fulfills these requirements, but resolution limitations and artefact formation hinder obtaining accurate structural information on the scale comparable to the pipette tip. Here, we present a novel technique, super-resolution SICM (SR-SICM), based on image deconvolution using simulated pipette point-spread functions. The technique is demonstrated on different types of nanostructures, where it surpasses the lateral resolution limit of SICM and mitigates imaging artefacts considerably. SR-SICM is applicable to any SICM dataset through user-friendly downloadable software promoting the possibility of single-molecule studies on a routine basis.