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<p>Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-hungry nature of monochromatic DFXM limits its applicability for studying highly deformed or weakly crystalline structures, and constrains time-resolved studies in industrially relevant materials. Here, we present pink-beam DFXM (pDFXM) at the ID03 beamline of ESRF, achieving a 27-fold increase in diffracted intensity while maintaining 100 nm spatial resolution. We validate pDFXM by imaging a partially recrystallized aluminum grain, confirming sufficient angular resolution for microstructure mapping. The increased flux significantly enhances the diffracted signal, enabling the resolution of subgrain structures. Additionally, we image a highly deformed ferritic iron grain, previously inaccessible in monochromatic mode without focusing optics. Beyond static imaging, pDFXM enables real-time tracking of grain growth during annealing, achieving hundred-millisecond temporal resolution. By combining high photon flux with non-destructive, high-resolution 3D mapping, pDFXM expands diffraction-contrast imaging to poorly diffracting crystals, unlocking new opportunities for studying grain growth, fatigue, and corrosion in bulk materials.</p>

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3D/4D imaging of complex and deformed microstructures with pink-beam dark field X-ray microscopy

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2025年8月29日

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  • Can Yildirim,
  • Aditya Shukla,
  • Yubin Zhang,
  • Nikolas Mavrikakis,
  • Louis Lesage,
  • Virginia Sanna,
  • Marilyn Sarkis,
  • Yaozhu Li,
  • Michela La Bella,
  • Carsten Detlefs,
  • Henning Friis Poulsen

摘要

Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-hungry nature of monochromatic DFXM limits its applicability for studying highly deformed or weakly crystalline structures, and constrains time-resolved studies in industrially relevant materials. Here, we present pink-beam DFXM (pDFXM) at the ID03 beamline of ESRF, achieving a 27-fold increase in diffracted intensity while maintaining 100 nm spatial resolution. We validate pDFXM by imaging a partially recrystallized aluminum grain, confirming sufficient angular resolution for microstructure mapping. The increased flux significantly enhances the diffracted signal, enabling the resolution of subgrain structures. Additionally, we image a highly deformed ferritic iron grain, previously inaccessible in monochromatic mode without focusing optics. Beyond static imaging, pDFXM enables real-time tracking of grain growth during annealing, achieving hundred-millisecond temporal resolution. By combining high photon flux with non-destructive, high-resolution 3D mapping, pDFXM expands diffraction-contrast imaging to poorly diffracting crystals, unlocking new opportunities for studying grain growth, fatigue, and corrosion in bulk materials.