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<p>In the life sciences, cryogenic electron microscopy (cryo-EM) has revolutionized structure determination by providing atomic-resolution structures of biomolecules in their native environment and in multiple conformational states. The applications of cryo-EM techniques have been extended from structural biology, which mainly focuses on structural information, to materials science, where chemical and physical information are equally important. In this Technical Review, we focus on sample preparation methods and imaging strategies to enable high-resolution imaging of beam-sensitive materials while avoiding electron-beam damage. We also survey emerging methods and applications, with an emphasis on energy materials.</p>

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Cryogenic electron microscopy and tomography for beam-sensitive materials

  • 期刊论文

  • 发表日期：

    2025年12月5日

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  • Yi Cui,
  • Zewen Zhang,
  • Robert Sinclair,
  • Wah Chiu,
  • Yi Cui

摘要

In the life sciences, cryogenic electron microscopy (cryo-EM) has revolutionized structure determination by providing atomic-resolution structures of biomolecules in their native environment and in multiple conformational states. The applications of cryo-EM techniques have been extended from structural biology, which mainly focuses on structural information, to materials science, where chemical and physical information are equally important. In this Technical Review, we focus on sample preparation methods and imaging strategies to enable high-resolution imaging of beam-sensitive materials while avoiding electron-beam damage. We also survey emerging methods and applications, with an emphasis on energy materials.