Scholarlink

<p>Crystallographic texture strongly influences the macroscopic properties of materials, making its precise characterization important for materials research. Conventional monochromatic X-ray diffraction is constrained by low X-ray flux in laboratory systems and inaccessibility of synchrotron-based instruments for industrial use. Polychromatic X-ray diffraction is promising, but complex diffraction patterns limit its use in texture analysis. Here we show a laboratory-based methodology for rapid and quantitative texture characterization of strongly fiber-textured materials using polychromatic X-ray diffraction without monochromators or energy-resolving detectors. We find that X-ray spectrum and texture information are inherently decoupled within the diffraction patterns of such symmetric systems, which simplifies the analysis. Using high-performance fiber-textured magnets as a representative benchmark, we demonstrate that this methodology reduces measurement time and enables spatially resolved analysis. This methodology provides an efficient method for texture characterization of fiber-textured magnets and has potential applications to other materials with similar texture symmetry.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

A laboratory-based method for rapid characterization of fiber texture using polychromatic X-ray diffraction

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2026年5月15日

查看全文
  • Wenjie Yu,
  • Huidong Qian,
  • Jincheng Lu,
  • Peixuan Song,
  • Lei Hu,
  • Li Zhang,
  • Zhiqiang Chen,
  • Zheng Li,
  • Jinbo Yang,
  • Yingchang Yang,
  • Jingzhi Han,
  • Zhentian Wang

摘要

Crystallographic texture strongly influences the macroscopic properties of materials, making its precise characterization important for materials research. Conventional monochromatic X-ray diffraction is constrained by low X-ray flux in laboratory systems and inaccessibility of synchrotron-based instruments for industrial use. Polychromatic X-ray diffraction is promising, but complex diffraction patterns limit its use in texture analysis. Here we show a laboratory-based methodology for rapid and quantitative texture characterization of strongly fiber-textured materials using polychromatic X-ray diffraction without monochromators or energy-resolving detectors. We find that X-ray spectrum and texture information are inherently decoupled within the diffraction patterns of such symmetric systems, which simplifies the analysis. Using high-performance fiber-textured magnets as a representative benchmark, we demonstrate that this methodology reduces measurement time and enables spatially resolved analysis. This methodology provides an efficient method for texture characterization of fiber-textured magnets and has potential applications to other materials with similar texture symmetry.