Scholarlink

<p>The development of low-power computing sectors requires compact, power-efficient and high-performance integrated circuits. Hybrid technology that combines n-type metal oxide thin-film transistors and p-type organic thin-film transistors offers a potential solution. However, increasing the transistor density of these systems through vertical stacking is challenging due to issues related to thermal budget and interface roughness. Here we report a six-stack hybrid complementary transistor technology that has 41 layers and uses n-type indium oxide (In<sub>2</sub>O<sub>3</sub>) and a p-type organic semiconductor (C16IDT-BT) as channel materials. We test 600 transistors and show that n-type oxide devices and p-type organic devices exhibit comparable field-effect mobilities and saturation currents. We also create 300 hybrid inverters by integrating the oxide and organic transistors; the circuits exhibit a gain of 94.84 V V<sup>−1</sup> and a power consumption of 0.47 µW. We also fabricate NAND and NOR gates comprising transistors from four stacks. Thermal stability analysis shows that device characteristics begin to degrade above 50 °C, a known limitation of low-thermal-budget processes. Such performance is sufficient for many large-area electronics applications, but further thermal optimization will be necessary to extend operational robustness towards standard industrial conditions.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Three-dimensional integrated hybrid complementary circuits for large-area electronics

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2025年10月17日

查看全文
  • Saravanan Yuvaraja,
  • Mohamad Insan Nugraha,
  • Qiao He,
  • Leo Raj Solay,
  • Patsy Arely Miranda Cortez,
  • Na Xiao,
  • Martin Heeney,
  • Thomas D. Anthopoulos,
  • Xiaohang Li

摘要

The development of low-power computing sectors requires compact, power-efficient and high-performance integrated circuits. Hybrid technology that combines n-type metal oxide thin-film transistors and p-type organic thin-film transistors offers a potential solution. However, increasing the transistor density of these systems through vertical stacking is challenging due to issues related to thermal budget and interface roughness. Here we report a six-stack hybrid complementary transistor technology that has 41 layers and uses n-type indium oxide (In2O3) and a p-type organic semiconductor (C16IDT-BT) as channel materials. We test 600 transistors and show that n-type oxide devices and p-type organic devices exhibit comparable field-effect mobilities and saturation currents. We also create 300 hybrid inverters by integrating the oxide and organic transistors; the circuits exhibit a gain of 94.84 V V−1 and a power consumption of 0.47 µW. We also fabricate NAND and NOR gates comprising transistors from four stacks. Thermal stability analysis shows that device characteristics begin to degrade above 50 °C, a known limitation of low-thermal-budget processes. Such performance is sufficient for many large-area electronics applications, but further thermal optimization will be necessary to extend operational robustness towards standard industrial conditions.