Structural, dielectric, and radiation shielding properties of erbium doped phosphate glasses
摘要
Novel phosphate glasses augmented with different amounts of the erbium (Er2O3) oxide were created in this work using the melt-quench process. The amorphous nature was verified by X-ray diffraction (XRD) investigation. The density for the resultant glass sample is increased when P2O5 is substituted with Er2O3. The structure of current glasses was investigated using Fourier transform infrared (FTIR) spectroscopy. Increased local ordering and the creation of Er-linked cross-bridges (Er–O–P interactions), which lower NBO concentration, are two structural changes brought about by Er2O3 doping up to 0.5 mol%. The dielectric properties were assessed throughout a wide frequency spectrum. Two distinct parts show the frequency dependence of the dielectric constant, ε′: a falling portion during small frequencies and a plateau portion over large frequencies. It is clear that (ε′) declines at 0.25 as well as 0.5 mol% Er2O3 and continuously increases at higher concentrations. Additionally, (σac) exhibits a similar trend, declining at Er2O3 values of 0.25 and 0.5 mol% and gradually increasing at higher concentrations. The computability of glass through cross linked at low Er doping is the main reason for reduction in ε′, and σac. The Er-0.5 specimen with a minimum (ε′) and ac conductivity is the ideal option for packing material because to its maximal propagation velocity. Phy-X/PSD software was used to calculate the mean free path (GMFP), equivalent atomic number (GZeq), and fast neutron removal cross-sections (GFNRCS). Furthermore, build up factors (GBF) were calculated for photon energies from 0.015 to 15 MeV and penetration depths from 0.5 to 40 mfp by using the G-P fitting technique. Er-1.0 sample has provided greater gamma-ray shielding than other samples, according to the results. Additionally, these findings highlight the potential of these glasses for radiation shielding in medical and industrial applications.