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<p>This study presents a disruptive, non-invasive diagnostic framework for the high-resolution electromagnetic characterization of sinusoidally modulated High Impedance Surfaces (HIS). Traditional near-field scanning techniques, while standardized, are inherently limited by probe-induced field perturbations and restricted spatial throughput. To overcome these constraints, we propose and validate the use of transient infrared (IR) thermography as a high-fidelity electromagnetic-to-thermal transducer. Operating within the 2.1–2.4 GHz spectrum, we demonstrate that the thermal signature captured on a high-emissivity Arlon substrate serves as a precise metrological proxy for Bloch mode propagation and energy localization. By synchronizing frequency-domain vector network analysis with spatial thermal mapping, we achieve a direct experimental extraction of the guided wavelength (<InlineEquation ID="IEq1"> <EquationSource Format="TEX">\(\lambda _g\)</EquationSource> </InlineEquation>) and the Slow-Wave Factor (SWF). Our quantitative assessment reveals a remarkable wavelength compression in the HIS prototype, reaching an SWF of 6.56 at 2.339 GHz, which correlates with a profound resonance dip of -21.09 dB. The temporal stability of the standing wave patterns observed during the transient heating phase (0–60 s) confirms the excitation of stable Bloch modes and validates the methodology’s ability to decouple electromagnetic signatures from lateral heat diffusion. These results establish transient IR thermography as a robust, high-throughput alternative for validating complex periodic metasurfaces, providing a strategic pathway for the optimization of next-generation wearable shielding and electromagnetic compliance in augmented/virtual (AR/VR) technologies.</p>

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Non-invasive near-field characterization of Bloch mode dispersion in sinusoidally modulated metasurfaces via transient infrared thermography

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2026年5月15日

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  • Simona Miclaus,
  • Ladislau Matekovits

摘要

This study presents a disruptive, non-invasive diagnostic framework for the high-resolution electromagnetic characterization of sinusoidally modulated High Impedance Surfaces (HIS). Traditional near-field scanning techniques, while standardized, are inherently limited by probe-induced field perturbations and restricted spatial throughput. To overcome these constraints, we propose and validate the use of transient infrared (IR) thermography as a high-fidelity electromagnetic-to-thermal transducer. Operating within the 2.1–2.4 GHz spectrum, we demonstrate that the thermal signature captured on a high-emissivity Arlon substrate serves as a precise metrological proxy for Bloch mode propagation and energy localization. By synchronizing frequency-domain vector network analysis with spatial thermal mapping, we achieve a direct experimental extraction of the guided wavelength ( \(\lambda _g\) ) and the Slow-Wave Factor (SWF). Our quantitative assessment reveals a remarkable wavelength compression in the HIS prototype, reaching an SWF of 6.56 at 2.339 GHz, which correlates with a profound resonance dip of -21.09 dB. The temporal stability of the standing wave patterns observed during the transient heating phase (0–60 s) confirms the excitation of stable Bloch modes and validates the methodology’s ability to decouple electromagnetic signatures from lateral heat diffusion. These results establish transient IR thermography as a robust, high-throughput alternative for validating complex periodic metasurfaces, providing a strategic pathway for the optimization of next-generation wearable shielding and electromagnetic compliance in augmented/virtual (AR/VR) technologies.