Non-ergodic dissociative valence double ionization of SF6
摘要
The dissociative double ionization of sulphur hexafluoride, SF6, in the ionization energy range from threshold up to 48.4 eV has been examined in detail using a multiple coincidence electron-ion technique. The results are interpreted by comparison with molecular dynamics simulations, high level molecular structure calculations and with a statistical model of the ion breakdown. Comparison between the experimental breakdown pattern and the pattern derived on the basis of statistical theory indicates that the energy redistribution required for fully statistical behaviour is incomplete on the timescale of the dissociation reactions of