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Solution-derived Ge–Sb–Se–Te phase-change chalcogenide films

  • Myungkoo Kang,
  • Rashi Sharma,
  • Cesar Blanco,
  • Daniel Wiedeman,
  • Quentin Altemose,
  • Patrick E. Lynch,
  • Gil B. J. Sop Tagne,
  • Yifei Zhang,
  • Mikhail Y. Shalaginov,
  • Cosmin-Constantin Popescu,
  • Brandon M. Triplett,
  • Clara Rivero-Baleine,
  • Casey M. Schwarz,
  • Anuradha M. Agarwal,
  • Tian Gu,
  • Juejun Hu,
  • Kathleen A. Richardson

摘要

Ge–Sb–Se–Te chalcogenides, namely Se-substituted Ge–Sb–Te, have been developed as an alternative optical phase change material (PCM) with a high figure-of-merit. A need for the integration of such new PCMs onto a variety of photonic platforms has necessitated the development of fabrication processes compatible with diverse material compositions as well as substrates of varying material types, shapes, and sizes. This study explores the application of chemical solution deposition as a method capable of creating conformally coated layers and delves into the resulting modifications in the structural and optical properties of Ge–Sb–Se–Te PCMs. Specifically, we detail the solution-based deposition of Ge–Sb–Se–Te layers and present a comparative analysis with those deposited via thermal evaporation. We also discuss our ongoing endeavor to improve available choice of processing-material combinations and how to realize solution-derived high figure-of-merit optical PCM layers, which will enable a new era for the development of reconfigurable photonic devices.