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Universal inverse modeling of point spread functions for SMLM localization and microscope characterization

  • Sheng Liu,
  • Jianwei Chen,
  • Jonas Hellgoth,
  • Lucas-Raphael Müller,
  • Boris Ferdman,
  • Christian Karras,
  • Dafei Xiao,
  • Keith A. Lidke,
  • Rainer Heintzmann,
  • Yoav Shechtman,
  • Yiming Li,
  • Jonas Ries

摘要

The point spread function (PSF) of a microscope describes the image of a point emitter. Knowing the accurate PSF model is essential for various imaging tasks, including single-molecule localization, aberration correction and deconvolution. Here we present universal inverse modeling of point spread functions (uiPSF), a toolbox to infer accurate PSF models from microscopy data, using either image stacks of fluorescent beads or directly images of blinking fluorophores, the raw data in single-molecule localization microscopy (SMLM). Our modular framework is applicable to a variety of microscope modalities and the PSF model incorporates system- or sample-specific characteristics, for example, the bead size, field- and depth- dependent aberrations, and transformations among channels. We demonstrate its application in single or multiple channels or large field-of-view SMLM systems, 4Pi-SMLM, and lattice light-sheet microscopes using either bead data or single-molecule blinking data.