<p>Quantum Error Mitigation is essential for enhancing the reliability of quantum computing experiments. The adaptive KIK error mitigation method has demonstrated significant advantages, including resilience to temporal noise drifts, applicability to non-Clifford gates, and guaranteed performance bounds. However, its reliance on global noise amplification introduces limitations, such as incompatibility with mid-circuit measurements and dynamic circuits, as well as small residual errors due to unaccounted high-order Magnus noise terms. In this work, we propose a layer-based noise amplification approach that overcomes these challenges without incurring additional overhead or experimental complexity. Since the Layered KIK method is inherently compatible with mid-circuit measurements, it enables seamless integration with quantum error correction codes. This synergy allows error correction to address dominant noise mechanisms, while the Layered KIK suppresses residual errors arising from leakage and correlated noise sources. Similarly, for reducing sampling costs, Layered KIK can be combined with complementary mitigation methods for providing drift resilience and broadening the range of addressable errors.</p>

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Layered KIK quantum error mitigation for dynamic circuits

  • Ben Bar,
  • Jader P. Santos,
  • Raam Uzdin

摘要

Quantum Error Mitigation is essential for enhancing the reliability of quantum computing experiments. The adaptive KIK error mitigation method has demonstrated significant advantages, including resilience to temporal noise drifts, applicability to non-Clifford gates, and guaranteed performance bounds. However, its reliance on global noise amplification introduces limitations, such as incompatibility with mid-circuit measurements and dynamic circuits, as well as small residual errors due to unaccounted high-order Magnus noise terms. In this work, we propose a layer-based noise amplification approach that overcomes these challenges without incurring additional overhead or experimental complexity. Since the Layered KIK method is inherently compatible with mid-circuit measurements, it enables seamless integration with quantum error correction codes. This synergy allows error correction to address dominant noise mechanisms, while the Layered KIK suppresses residual errors arising from leakage and correlated noise sources. Similarly, for reducing sampling costs, Layered KIK can be combined with complementary mitigation methods for providing drift resilience and broadening the range of addressable errors.