A meta-analysis of semiconductor materials fabricated in microgravity
摘要
This meta-analysis of 160 semiconductor crystals that were grown in microgravity on orbital vehicles between 1973 and 2016 is based on publicly available information documented in the literature. This analysis provides comparisons of crystal metrics including size, structure quality, uniformity, and improved performance between crystals grown in microgravity or terrestrially. Improvement in at least one of these metrics was observed for 86% of those materials that included data in their studies.