<p>Most AI-for-Materials research to date has focused on ideal crystals, whereas real-world materials inevitably contain defects that play a critical role in modern functional technologies. The defects break geometric symmetry and increase interaction complexity, posing particular challenges for traditional ML models. Here, we introduce Defect-Informed Equivariant Graph Neural Network (DefiNet), a model specifically designed to accurately capture defect-related interactions and geometric configurations in point-defect structures. DefiNet achieves near-DFT-level structural predictions in milliseconds using a single GPU. To validate its accuracy, we perform DFT relaxations using DefiNet-predicted structures as initial configurations and measure the residual ionic steps. For most defect structures, regardless of defect complexity or system size, only 3 ionic steps are required to reach the DFT-level ground state. Finally, comparisons with scanning transmission electron microscopy (STEM) images confirm DefiNet’s scalability and extrapolation beyond point defects, positioning it as a valuable tool for defect-focused materials research.</p>

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Modeling crystal defects using defect informed neural networks

  • Ziduo Yang,
  • Xiaoqing Liu,
  • Xiuying Zhang,
  • Pengru Huang,
  • Kostya S. Novoselov,
  • Lei Shen

摘要

Most AI-for-Materials research to date has focused on ideal crystals, whereas real-world materials inevitably contain defects that play a critical role in modern functional technologies. The defects break geometric symmetry and increase interaction complexity, posing particular challenges for traditional ML models. Here, we introduce Defect-Informed Equivariant Graph Neural Network (DefiNet), a model specifically designed to accurately capture defect-related interactions and geometric configurations in point-defect structures. DefiNet achieves near-DFT-level structural predictions in milliseconds using a single GPU. To validate its accuracy, we perform DFT relaxations using DefiNet-predicted structures as initial configurations and measure the residual ionic steps. For most defect structures, regardless of defect complexity or system size, only 3 ionic steps are required to reach the DFT-level ground state. Finally, comparisons with scanning transmission electron microscopy (STEM) images confirm DefiNet’s scalability and extrapolation beyond point defects, positioning it as a valuable tool for defect-focused materials research.