Scholarlink

<p>Atomic-scale defects govern materials properties, with their influence amplified in low-dimensional systems. Understanding and controlling such defects is therefore essential for both fundamental science and technological applications. However, precise defect identification and localization remain major challenges. Lateral force microscopy (LFM), an atomic force microscopy mode that measures friction forces through the lateral torsion of the cantilever, is an appealing technique for probing surface properties. Nevertheless, it has conventionally been regarded as insensitive to structural features beneath the topmost atomic layer. In this study, we overturn this paradigm by demonstrating that LFM can not only detect but also classify atomic vacancies in MoS<sub>2</sub> according to their depth. By combining experiments with molecular dynamics and Prandtl-Tomlinson (PT) modeling, we identify unique frictional fingerprints associated with each defect type: surface vacancies produce a characteristic ’drop-and-rise’ signature, whereas subsurface vacancies generate a pronounced exit barrier without an entry drop. While molecular dynamics validates these specific MoS<sub>2</sub> signatures, the PT model reveals a generic, geometric lattice-disruption mechanism, extending the validity of our findings beyond MoS<sub>2</sub>. Furthermore, we apply these findings to compare the defect density and defect types in MoS<sub>2</sub> flakes obtained via chemical vapor deposition (CVD) and mechanical exfoliation.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Unveiling surface and subsurface atomic vacancies in MoS2 with lateral force microscopy

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2026年7月9日

查看全文
  • Oscar Gutiérrez-Varela,
  • Aitor Zambudio,
  • Pablo Ares,
  • Julio Gómez-Herrero,
  • Enrico Gnecco,
  • Jaime Colchero,
  • J. G. Vilhena,
  • Cristina Gómez-Navarro

摘要

Atomic-scale defects govern materials properties, with their influence amplified in low-dimensional systems. Understanding and controlling such defects is therefore essential for both fundamental science and technological applications. However, precise defect identification and localization remain major challenges. Lateral force microscopy (LFM), an atomic force microscopy mode that measures friction forces through the lateral torsion of the cantilever, is an appealing technique for probing surface properties. Nevertheless, it has conventionally been regarded as insensitive to structural features beneath the topmost atomic layer. In this study, we overturn this paradigm by demonstrating that LFM can not only detect but also classify atomic vacancies in MoS2 according to their depth. By combining experiments with molecular dynamics and Prandtl-Tomlinson (PT) modeling, we identify unique frictional fingerprints associated with each defect type: surface vacancies produce a characteristic ’drop-and-rise’ signature, whereas subsurface vacancies generate a pronounced exit barrier without an entry drop. While molecular dynamics validates these specific MoS2 signatures, the PT model reveals a generic, geometric lattice-disruption mechanism, extending the validity of our findings beyond MoS2. Furthermore, we apply these findings to compare the defect density and defect types in MoS2 flakes obtained via chemical vapor deposition (CVD) and mechanical exfoliation.