Scholarlink

<p>Inorganic all-solid-state electrochromic devices (ECDs) are promising for smart windows and adaptive optoelectronics, but they often suffer from insufficient optical contrast, slow switching kinetics and poor cycling stability. High-voltage operation enhances optical modulation and redox kinetics, yet it accelerates metastable phase transitions and structural degradation. Here, we reveal that the degradation of NiO-based ECDs under high-voltage cycling originates from strengthened Ni-O covalency and the accumulation of metastable H1-3 phases, during the O3-O1 transition, which suppresses Ni regeneration and stress-buffering heterojunctions formation. To address this, we propose a covalency modulation strategy via Mo<sup>6+</sup> doping. In-situ characterizations and theoretical calculations reveal that Mo incorporation weakens Ni–O bonding, enabling the in-situ formation of regenerable Ni/Mo<sub>x</sub>Ni<sub>1-x</sub>O<sub>y</sub> heterojunctions. The resulting ECD achieves exceptional durability over 17,000 cycles without performance degradation, together with high optical modulation (82.09%) and superior coloration efficiency (236.51 cm<sup>2</sup> C<sup>−1</sup>),&#xa0;providing a general strategy toward durable high-voltage electrochromic and energy devices.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Covalency modulation doping enables durable high-voltage operation in NiO-based all-solid-state electrochromic devices

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2026年4月25日

查看全文
  • Dukang Yan,
  • Huawei Bai,
  • Liwei Cao,
  • Yang Li,
  • Shuokun Sun,
  • Sunan Tian,
  • Yuwei Zhao,
  • Xiang Zhang,
  • Ang Li,
  • Xiaoxu Liu,
  • Mingjun Chen,
  • Jiupeng Zhao,
  • Yao Li,
  • Xiaodong Han

摘要

Inorganic all-solid-state electrochromic devices (ECDs) are promising for smart windows and adaptive optoelectronics, but they often suffer from insufficient optical contrast, slow switching kinetics and poor cycling stability. High-voltage operation enhances optical modulation and redox kinetics, yet it accelerates metastable phase transitions and structural degradation. Here, we reveal that the degradation of NiO-based ECDs under high-voltage cycling originates from strengthened Ni-O covalency and the accumulation of metastable H1-3 phases, during the O3-O1 transition, which suppresses Ni regeneration and stress-buffering heterojunctions formation. To address this, we propose a covalency modulation strategy via Mo6+ doping. In-situ characterizations and theoretical calculations reveal that Mo incorporation weakens Ni–O bonding, enabling the in-situ formation of regenerable Ni/MoxNi1-xOy heterojunctions. The resulting ECD achieves exceptional durability over 17,000 cycles without performance degradation, together with high optical modulation (82.09%) and superior coloration efficiency (236.51 cm2 C−1), providing a general strategy toward durable high-voltage electrochromic and energy devices.