Scholarlink

<p>Optimizing the performance of organic solar cells hinges on a comprehensive understanding of their nanostructures, yet traditional characterization methods often fall short, delivering incomplete structural snapshots. We introduce elastically filtered 3D electron diffraction as technique to bridge full reciprocal- and real-space structural analysis within a single transmission electron microscope. Using model bulk heterojunction DRCN5T:PC<sub>71</sub>BM, 3D electron diffraction reproduces key structural parameters obtained from grazing-incidence wide-angle X-ray scattering, including lattice spacings, coherence lengths, and mosaicity, while also providing true in-plane access and direct registration with high-resolution imaging, diffraction imaging and nano-spectroscopy on the same sample. Application to another archetypal blend, P3HT:PC<sub>71</sub>BM, demonstrates the generality of the method. Our findings underscore the transformative potential of 3D electron diffraction, particularly in analyzing beam-sensitive organic thin films. The method enables correlative structural characterization of organic solar cells and opens pathways for application to a wide range of other nanostructured materials.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

3D electron diffraction—the missing slice completing nanoscale analysis of organic solar cells in TEM

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2026年4月15日

查看全文
  • Irene Kraus,
  • Mingjian Wu,
  • Stefanie Rechberger,
  • Johannes Will,
  • Santanu Maiti,
  • Konstantin Dengel,
  • Andreas Kuhlmann,
  • Marten Huck,
  • Larry Lüer,
  • Florian Bertram,
  • Hans-Georg Steinrück,
  • Tobias Unruh,
  • Christoph J. Brabec,
  • Erdmann Spiecker

摘要

Optimizing the performance of organic solar cells hinges on a comprehensive understanding of their nanostructures, yet traditional characterization methods often fall short, delivering incomplete structural snapshots. We introduce elastically filtered 3D electron diffraction as technique to bridge full reciprocal- and real-space structural analysis within a single transmission electron microscope. Using model bulk heterojunction DRCN5T:PC71BM, 3D electron diffraction reproduces key structural parameters obtained from grazing-incidence wide-angle X-ray scattering, including lattice spacings, coherence lengths, and mosaicity, while also providing true in-plane access and direct registration with high-resolution imaging, diffraction imaging and nano-spectroscopy on the same sample. Application to another archetypal blend, P3HT:PC71BM, demonstrates the generality of the method. Our findings underscore the transformative potential of 3D electron diffraction, particularly in analyzing beam-sensitive organic thin films. The method enables correlative structural characterization of organic solar cells and opens pathways for application to a wide range of other nanostructured materials.