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<p>Dark-field X-ray imaging visualizes structural inhomogeneities through small-angle scattering, but existing directional methods are confined to the micrometer scale. While recent advances have extended dark field capabilities to nanoscale transmission X-ray microscopy, directional scattering retrieval – critical for characterizing anisotropic nanostructures – has remained inaccessible for imaging resolutions in the sub-micrometer scale. Here, we demonstrate the first directional dark-field setup for nanoimaging, achieving orientation mapping of scattering features below the spatial resolution limit. Our method is experimentally simple to implement with existing transmission X-ray microscopy setups. We validate its performance by successfully resolving sub-resolution test structure orientations, cross-correlating orientational changes within hierarchical nanoporous materials, and mapping the directional arrangement of hydroxyapatite nanocrystals (30–70 nm) within human tooth enamel. By utilizing shadow regions in the optical configuration, we further extend the detectable scattering vector range, demonstrating a pathway toward size-selective dark-field imaging. This advancement enables the quantitative structural characterization of anisotropic nanomaterials, which are critical to biomineralization, advanced materials, and nanotechnology applications.</p>

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Directional dark field for nanoscale full-field transmission X-ray microscopy

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2026年5月8日

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  • Sami Wirtensohn,
  • Silja Flenner,
  • Dominik John,
  • Peng Qi,
  • Christian David,
  • Manfred May,
  • Patrick Huber,
  • Dirk Herzog,
  • Stefan Tangl,
  • Carina Kampleitner,
  • Kritika Singh,
  • Ingomar Kelbassa,
  • Katrin Bekes,
  • Julia Herzen,
  • Imke Greving

摘要

Dark-field X-ray imaging visualizes structural inhomogeneities through small-angle scattering, but existing directional methods are confined to the micrometer scale. While recent advances have extended dark field capabilities to nanoscale transmission X-ray microscopy, directional scattering retrieval – critical for characterizing anisotropic nanostructures – has remained inaccessible for imaging resolutions in the sub-micrometer scale. Here, we demonstrate the first directional dark-field setup for nanoimaging, achieving orientation mapping of scattering features below the spatial resolution limit. Our method is experimentally simple to implement with existing transmission X-ray microscopy setups. We validate its performance by successfully resolving sub-resolution test structure orientations, cross-correlating orientational changes within hierarchical nanoporous materials, and mapping the directional arrangement of hydroxyapatite nanocrystals (30–70 nm) within human tooth enamel. By utilizing shadow regions in the optical configuration, we further extend the detectable scattering vector range, demonstrating a pathway toward size-selective dark-field imaging. This advancement enables the quantitative structural characterization of anisotropic nanomaterials, which are critical to biomineralization, advanced materials, and nanotechnology applications.