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<p>A recent study employing high-spatial-resolution photoemission electron microscopy (PEEM) achieved, for the first time, weak-disturbance imaging of the ultra-confined nanoslit mode in a coupled nanowire pair (CNP), revealing its quasi-three-dimensional field distribution.</p>

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Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2026年1月3日

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  • Bowen Wang,
  • Qian Chen,
  • Chao Zuo

摘要

A recent study employing high-spatial-resolution photoemission electron microscopy (PEEM) achieved, for the first time, weak-disturbance imaging of the ultra-confined nanoslit mode in a coupled nanowire pair (CNP), revealing its quasi-three-dimensional field distribution.