<p>Portable X-ray fluorescence spectrometry (pXRF) holds significant value in archaeological studies of cultural relics. However, previous studies indicate that non-destructive elemental analysis of jade and stone artifacts using pXRF may produce certain deviations. To address this issue, jade and stone artifacts unearthed from the Sanxingdui and Lianhe sites were analyzed through a combination of techniques, including macroscopic examination, thin-section microscopy, Raman spectroscopy, WD-XRF, pXRF, scanning electron microscopy, and energy-dispersive spectroscopy. This study systematically investigates the primary causes of deviations in pXRF elemental analysis and proposes corresponding correction approaches. The results demonstrate that systematic instrumental error is the main factor affecting the accuracy of pXRF data. After correction, the data can effectively support the lithological identification of these artifacts. Furthermore, the established correction equation provides an important reference for the pXRF analysis of jade and stone artifacts from other sites in the Chengdu Plain with similar chronological, burial, and post-depositional conditions.</p>