Model prediction-based switch open-circuit fault diagnosis and localization for MMCs
摘要
In this paper, a model prediction-based switch open-circuit fault diagnosis and location (FDL) method for modular multilevel converters (MMCs) is proposed. It mainly consists of a submodule (SM) capacitor voltage prediction model (CVPM). With the CVPM, the predicted capacitor voltage can be obtained via the arm current and the modified switching function. By comparing the predicted capacitor voltage with a sensor measured value, single or multiple switch faults can be located in time. In addition, for the first time, a CVPM is established to quantitatively characterize faulty SM capacitor voltage when two switches in a SM are simultaneously open-circuited. The FDL method has ability to identify an implicit failure state, which is not different from normal SMs. Finally, the proposed FDL method and CVPM are validated through simulation and experimental results.