<p>Wheat (<i>Triticum aestivum</i> L.) is one of the most important staple crops globally, contributing substantially to human caloric and protein intake. However, its production and trade face significant challenges from Karnal bunt (KB), a fungal disease caused by <i>Tilletia indica</i>. While yield losses due to KB are typically minimal, the disease drastically reduces grain quality and marketability, primarily through seed discoloration and trimethylamine contamination. Consequently, its presence imposes stringent quarantine restrictions and trade barriers, particularly in wheat-exporting countries. Developing resistant cultivars has therefore emerged as the most sustainable and economically viable strategy for disease management. This review synthesizes current knowledge on the genetic basis of KB resistance, with a focus on the identification of quantitative trait loci (QTL), genomic regions, and associated molecular markers. Early inheritance studies established the polygenic and quantitative nature of resistance, which is controlled by additive and epistatic gene interactions. Advances in molecular mapping and genome-wide association studies have highlighted consistent resistance loci on chromosomes 3B, 4B, and 5B, alongside novel loci on different chromosomes. Molecular markers such as simple sequence repeats and high-throughput single-nucleotide polymorphism based assays have been instrumental in mapping these loci and in facilitating marker-assisted selection. Despite considerable progress, challenges remain due to pathogen variability, environmental influences on disease expression, and incomplete exploration of resistance diversity. Future directions include fine mapping of candidate loci, functional validation of resistance genes, and pyramiding of multiple QTL to achieve durable resistance. Integration of resistance from wild relatives and synthetic hexaploids further offers opportunities to broaden the genetic base. Collectively, the identification and deployment of stable genomic regions for KB resistance provide a critical foundation for breeding resilient wheat cultivars, ensuring sustainable production and mitigating trade-related constraints.</p>

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Genetic architecture of Karnal bunt resistance in wheat: A review

  • Rajesh Aggarwal,
  • Satish Kumar,
  • Vikram Singh,
  • Prem Lal Kashyap,
  • Chandra Nath Mishra,
  • Rajender Singh,
  • Ratan Tiwari

摘要

Wheat (Triticum aestivum L.) is one of the most important staple crops globally, contributing substantially to human caloric and protein intake. However, its production and trade face significant challenges from Karnal bunt (KB), a fungal disease caused by Tilletia indica. While yield losses due to KB are typically minimal, the disease drastically reduces grain quality and marketability, primarily through seed discoloration and trimethylamine contamination. Consequently, its presence imposes stringent quarantine restrictions and trade barriers, particularly in wheat-exporting countries. Developing resistant cultivars has therefore emerged as the most sustainable and economically viable strategy for disease management. This review synthesizes current knowledge on the genetic basis of KB resistance, with a focus on the identification of quantitative trait loci (QTL), genomic regions, and associated molecular markers. Early inheritance studies established the polygenic and quantitative nature of resistance, which is controlled by additive and epistatic gene interactions. Advances in molecular mapping and genome-wide association studies have highlighted consistent resistance loci on chromosomes 3B, 4B, and 5B, alongside novel loci on different chromosomes. Molecular markers such as simple sequence repeats and high-throughput single-nucleotide polymorphism based assays have been instrumental in mapping these loci and in facilitating marker-assisted selection. Despite considerable progress, challenges remain due to pathogen variability, environmental influences on disease expression, and incomplete exploration of resistance diversity. Future directions include fine mapping of candidate loci, functional validation of resistance genes, and pyramiding of multiple QTL to achieve durable resistance. Integration of resistance from wild relatives and synthetic hexaploids further offers opportunities to broaden the genetic base. Collectively, the identification and deployment of stable genomic regions for KB resistance provide a critical foundation for breeding resilient wheat cultivars, ensuring sustainable production and mitigating trade-related constraints.