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<p>This study investigates the effectiveness of three post-damp heat (DH) recovery protocols—current injection, light soaking, and thermal cycling—in mitigating boron-oxygen light-induced degradation (BO-LID) in p-type crystalline silicon photovoltaic modules. Mini modules encapsulated with EVA and POE were subjected to DH 1 000&#xa0;h followed by recovery tests per IEC 61215-2 MQT 19.3. Results indicate that current injection produced the most consistent recovery, with EVA modules achieving up to 17.5% recovery. Light soaking showed strong initial performance but lacked long-term stability, while thermal cycling often accelerated degradation. The findings highlight the significance of standardized recovery conditions and material-dependent behavior in long-term PV reliability assessment.</p>

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Evaluation of BO-LID Recovery Characteristics in PV Modules Under Various DH Recovery Condition

  • 期刊论文

  • 发表日期：

    2026年2月25日

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  • Young-Ho Cho,
  • Donggun Lim

摘要

This study investigates the effectiveness of three post-damp heat (DH) recovery protocols—current injection, light soaking, and thermal cycling—in mitigating boron-oxygen light-induced degradation (BO-LID) in p-type crystalline silicon photovoltaic modules. Mini modules encapsulated with EVA and POE were subjected to DH 1 000 h followed by recovery tests per IEC 61215-2 MQT 19.3. Results indicate that current injection produced the most consistent recovery, with EVA modules achieving up to 17.5% recovery. Light soaking showed strong initial performance but lacked long-term stability, while thermal cycling often accelerated degradation. The findings highlight the significance of standardized recovery conditions and material-dependent behavior in long-term PV reliability assessment.