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Geometric deep learning for enhanced quantitative analysis of microstructures in X-ray computed tomography data

  • M. Lapenna,
  • A. Tsamos,
  • F. Faglioni,
  • R. Fioresi,
  • F. Zanchetta,
  • G. Bruno

摘要

Quantitative microstructural analysis of XCT 3D images is key for quality assurance of materials and components. In this paper we implement a Graph Convolutional Neural Network (GCNN) architecture to segment a complex Al-Si Metal Matrix composite XCT volume (3D image). We train the model on a synthetic dataset and we assess its performance on both synthetic and experimental, manually-labeled, datasets. Our simple GCNN shows a comparable performance, measured via the Dice score, to more standard machine learning methods, but uses a greatly reduced number of parameters (less than 1/10 of parameters), features low training time, and needs little hardware resources. Our GCNN thus achieves a cost-effective reliable segmentation.