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<p>This work focuses on the effect of the top and bottom electrodes of PVDF/Ag/Glass and Ag/PVDF/Ag/Glass Multilayer Devices. The top Ag nanodots and bottom Ag thin film are deposited by direct current (DC) magnetron sputtering. Polyvinylidene fluoride (PVDF) thin films coated on Ag/Glass substrates with 2wt% of PVDF and Dimethyl Sulfoxide (DMSO) solvent by spin-coating in suit temperature method. The presence of polar phase β of PVDF is confirmed, utilizing Attenuated Total Reflectance - Fourier Transform Infrared Spectroscopy (ATR-FTIR), Atomic Force Microscopy (AFM) and Piezoforce Microscopy (PFM) to analyze the morphology and topology. Microscopy carries out in-depth analyses of the structural and piezoelectric properties. The more piezoelectric coefficient d<sub>33</sub> = 17.5pm/V with ± 0.5 to ± 2.0V coercive voltage obtained from PVDF/Ag/Glass than Ag/PVDF/Ag/Glass of 1.5&#xa0;pm/V with coercive voltage 0.4 to 1.4&#xa0;V. Analysis indicates the system is appropriate for use in flexible electronic devices and sensors because the optimized electrode structure significantly enhances the piezoelectric response.</p>

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Silver quantum dot surface sputtered electrode of PVDF/Ag multilayer devices with enhanced piezoelectric and ferroelectric properties

  • 期刊论文

  • 发表日期：

    2025年7月23日

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  • Shalini Selvam,
  • M. Vaishnavi,
  • M. S. Ravisankar,
  • Saravanan A,
  • J. Venkatamuthukumar,
  • Hamad Al-lohedan,
  • Selvaraj Arokiyaraj

摘要

This work focuses on the effect of the top and bottom electrodes of PVDF/Ag/Glass and Ag/PVDF/Ag/Glass Multilayer Devices. The top Ag nanodots and bottom Ag thin film are deposited by direct current (DC) magnetron sputtering. Polyvinylidene fluoride (PVDF) thin films coated on Ag/Glass substrates with 2wt% of PVDF and Dimethyl Sulfoxide (DMSO) solvent by spin-coating in suit temperature method. The presence of polar phase β of PVDF is confirmed, utilizing Attenuated Total Reflectance - Fourier Transform Infrared Spectroscopy (ATR-FTIR), Atomic Force Microscopy (AFM) and Piezoforce Microscopy (PFM) to analyze the morphology and topology. Microscopy carries out in-depth analyses of the structural and piezoelectric properties. The more piezoelectric coefficient d33 = 17.5pm/V with ± 0.5 to ± 2.0V coercive voltage obtained from PVDF/Ag/Glass than Ag/PVDF/Ag/Glass of 1.5 pm/V with coercive voltage 0.4 to 1.4 V. Analysis indicates the system is appropriate for use in flexible electronic devices and sensors because the optimized electrode structure significantly enhances the piezoelectric response.