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<p>The surface morphology of thin films plays a crucial role in determining their opto-electrical characteristics and the overall performance of photodetector devices. This study focuses on the deposition of SnS thin films onto glass substrates via thermal evaporation, analyzing the influence of film thickness and surface morphology on their optical and electrical properties. Detailed structural, morphological, optical and compositional analyses were conducted using, X-ray diffraction (XRD), Scanning electron microscopy (SEM), Atomic force microscopy (AFM), Ultraviolet-vis Spectroscopy (UV–Vis), and X-ray Photoelectron Spectroscopy<b> (</b>XPS). SEM images revealed flake-like, crack-free nanograins, while XPS confirmed the presence of Sn (II) oxidation states within the films. The research aimed to characterize the surface micromorphology through advanced surface analytical techniques, including contour line plots, Abbott-Firestone curves, furrow depth analysis, texture direction assessment, mono-fractal analysis. Contour line plots highlighted notable height variations across the surface, while the Abbott-Firestone curve provided insights into the distribution of elevated and recessed regions. Furrow depth analysis identified prominent valleys with an average depth of 60.19, 85.34 and 76.47&#xa0;nm. Texture direction analysis revealed isotropy values of 69.31%, 74.21%, and 63.75%, indicating a moderate degree of surface directionality. Fractal analysis confirmed the surface's self-similar nature, with a fractal dimension in the range from 2.83 to 2.23. Statistical parameters, such as a highest value of root mean square roughness of 169.61&#xa0;nm and a surface roughness of 144.32&#xa0;nm were observed for 400&#xa0;nm thin film, further confirming significant the surface roughness and height variations. The integration of these techniques provided a comprehensive understanding of the surface topography, which is critical for optimizing the functional properties of materials. The findings offer valuable insights into the structural features of SnS thin films, revealing how morphology influence the optical properties, including transmission, absorption and band gap energy. This study underscores the strong correlation between surface parameters such as grain size and roughness with optical properties. Photodetector performance was evaluated using an Al/p-SnS/glass device under 532&#xa0;nm illumination. I-V measurements demonstrated that film thickness has a pronounced impact on responsivity, detectivity, and sensitivity. The fabricated device for the thickness of 400&#xa0;nm, exhibited a maximum responsivity of 1.45&#xa0;mA/W and a photo-detectivity of 1.01 × 10⁷ Jones under a 2&#xa0;V bias. The photodetector showcased excellent photo response, with fast response times, high reproducibility, and stable operation over time. This comprehensive investigation underscores the critical interplay between surface morphology, optical properties, and device performance, paving the way for optimized SnS-based photodetectors.</p>

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Thickness-dependent surface morphology, fractality, and its influence on the opto-electrical performance of SnS thin films for photodetector applications

  • 期刊论文

  • 发表日期：

    2025年6月5日

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  • Vinita,
  • Chandra Kumar,
  • R. P. Yadav,
  • B. K. Singh

摘要

The surface morphology of thin films plays a crucial role in determining their opto-electrical characteristics and the overall performance of photodetector devices. This study focuses on the deposition of SnS thin films onto glass substrates via thermal evaporation, analyzing the influence of film thickness and surface morphology on their optical and electrical properties. Detailed structural, morphological, optical and compositional analyses were conducted using, X-ray diffraction (XRD), Scanning electron microscopy (SEM), Atomic force microscopy (AFM), Ultraviolet-vis Spectroscopy (UV–Vis), and X-ray Photoelectron Spectroscopy (XPS). SEM images revealed flake-like, crack-free nanograins, while XPS confirmed the presence of Sn (II) oxidation states within the films. The research aimed to characterize the surface micromorphology through advanced surface analytical techniques, including contour line plots, Abbott-Firestone curves, furrow depth analysis, texture direction assessment, mono-fractal analysis. Contour line plots highlighted notable height variations across the surface, while the Abbott-Firestone curve provided insights into the distribution of elevated and recessed regions. Furrow depth analysis identified prominent valleys with an average depth of 60.19, 85.34 and 76.47 nm. Texture direction analysis revealed isotropy values of 69.31%, 74.21%, and 63.75%, indicating a moderate degree of surface directionality. Fractal analysis confirmed the surface's self-similar nature, with a fractal dimension in the range from 2.83 to 2.23. Statistical parameters, such as a highest value of root mean square roughness of 169.61 nm and a surface roughness of 144.32 nm were observed for 400 nm thin film, further confirming significant the surface roughness and height variations. The integration of these techniques provided a comprehensive understanding of the surface topography, which is critical for optimizing the functional properties of materials. The findings offer valuable insights into the structural features of SnS thin films, revealing how morphology influence the optical properties, including transmission, absorption and band gap energy. This study underscores the strong correlation between surface parameters such as grain size and roughness with optical properties. Photodetector performance was evaluated using an Al/p-SnS/glass device under 532 nm illumination. I-V measurements demonstrated that film thickness has a pronounced impact on responsivity, detectivity, and sensitivity. The fabricated device for the thickness of 400 nm, exhibited a maximum responsivity of 1.45 mA/W and a photo-detectivity of 1.01 × 10⁷ Jones under a 2 V bias. The photodetector showcased excellent photo response, with fast response times, high reproducibility, and stable operation over time. This comprehensive investigation underscores the critical interplay between surface morphology, optical properties, and device performance, paving the way for optimized SnS-based photodetectors.