<p>Graphene and other two-dimensional (2D) materials have recently gained an unprecedented interest in Materials Science and Engineering due to their distinct properties and diverse potential applications. However, the characterization of graphene-based materials and devices might pose a challenge, particularly when placed on non-conductive substrates, where conventional imaging methods like scanning electron microscopy and Raman spectroscopy face certain limitations. To address this challenge, we propose to utilize diverse mechanical channels of atomic force microscopy (AFM) as an alternative and non-destructive imaging technique. Our study discusses different AFM visualization methods, namely, PeakForce Quantitative Nanomechanics (adhesion, dissipation, deformation), Ringing mode, and Tapping mode for single-layer graphene on model non-conductive substrates: free-standing parylene-N film and polymethylmethacrylate on SiO₂. We employed chemical vapor deposition (CVD) based on the Boudouard reaction (i.e., CO disproportionation) to produce graphene as a direct and controllable route toward single-layer islands with a controlled size. We demonstrated that standard mechanical channels of AFM, including adhesion, dissipation, deformation, and phase shift, yielded high-contrast images for single-layer graphene. Our findings open a new avenue for examining of novel 2D materials and their subsequent implementation in advanced optoelectronic and photonic devices.</p>