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Optimal time truncated double acceptance sampling plan for generalized half normal distribution

  • Harsh Tripathi,
  • A. Kiapour,
  • M. Naghizadeh Qomi

摘要

In this work, we developed a double acceptance sampling inspection plan ( \(\mathcal {DASP}\) DASP ) for time truncated life test when lifetime of the items is distributed according to generalized half normal ( \(\mathcal {GHN}\) GHN ) distribution. The significance of \(\mathcal {GHN}\) GHN is demonstrated with mean property. A general methodology of \(\mathcal {DASP}\) DASP in case of zero–one scheme is discussed with their mathematical expressions and also operating characteristic (OC) function for proposed plan is obtained with the probability of acceptance expression. The minimum ratio of true life to defined life is calculated and presented in tables for specified parameters. To demonstrate the applicability of the proposed study, a real-world illustration is given.