<p>In fringe projection profilometry 3D measurement systems, the measurement of surfaces with high variability in reflectivity poses a challenge due to the limited dynamic range of cameras. The main solution involves using multiple exposures to modulate fringe intensity; however, it is inefficient. In this study, we introduce an attention-guided end-to-end phase calculation network to accelerate the multi-exposure structured light process for high dynamic range (HDR) measurements. We use attention modules to guide feature selection, enhancing relevant features and suppressing irrelevant features. Using the 12-step phase-shifting profilometry (PSP) as ground truth, our method accurately extracts the sine and cosine components of the fundamental frequency from a single pattern to retrieve the absolute phases. Tested on our metallic dataset requiring HDR imaging, our method achieves an absolute phase error of 0.084, close to that of the six-step PSP method (0.069), while using only 16.7% of the time. On the ceramic dataset, our method achieves 0.021 phase error, close to that of the four-step PSP (0.012). In quantitative measurements, our method achieves an accuracy of approximately 40 <InlineEquation ID="IEq1"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="41871_2025_248_Article_IEq1.gif" Format="GIF" Height="13" Rendition="HTML" Resolution="72" Type="Linedraw" Width="26" /> </InlineMediaObject> <EquationSource Format="TEX">\(\upmu\text{m}\)</EquationSource> <EquationSource Format="MATHML"><math> <mrow> <mi mathvariant="normal">μ</mi> <mtext>m</mtext> </mrow> </math></EquationSource> </InlineEquation> on standard spheres and plates. Overall, our method preserves the accuracy of multi-exposure PSP methods while significantly accelerating the 3D reconstruction process.</p>

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A High-Accuracy and Reliable End-to-End Phase Calculation Network and Its Demonstration in High Dynamic Range 3D Reconstruction

  • Hao Wang,
  • Ziyu Lu,
  • Ziyang Huang,
  • Yiming Li,
  • Chaobo Zhang,
  • Xiang Qian,
  • Xiaohao Wang,
  • Weihua Gui,
  • Xiaojun Liang,
  • Xinghui Li

摘要

In fringe projection profilometry 3D measurement systems, the measurement of surfaces with high variability in reflectivity poses a challenge due to the limited dynamic range of cameras. The main solution involves using multiple exposures to modulate fringe intensity; however, it is inefficient. In this study, we introduce an attention-guided end-to-end phase calculation network to accelerate the multi-exposure structured light process for high dynamic range (HDR) measurements. We use attention modules to guide feature selection, enhancing relevant features and suppressing irrelevant features. Using the 12-step phase-shifting profilometry (PSP) as ground truth, our method accurately extracts the sine and cosine components of the fundamental frequency from a single pattern to retrieve the absolute phases. Tested on our metallic dataset requiring HDR imaging, our method achieves an absolute phase error of 0.084, close to that of the six-step PSP method (0.069), while using only 16.7% of the time. On the ceramic dataset, our method achieves 0.021 phase error, close to that of the four-step PSP (0.012). In quantitative measurements, our method achieves an accuracy of approximately 40 \(\upmu\text{m}\) μ m on standard spheres and plates. Overall, our method preserves the accuracy of multi-exposure PSP methods while significantly accelerating the 3D reconstruction process.