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<p>Entropy or randomness represents a foundational security property in security-related operations, such as key generation. Key generation in turn is central to security protocols such as authentication and encryption. Physical unclonable functions (PUF) are hardware-based primitives that can serve as key generation engines in modern microelectronic devices and applications. PUFs derive entropy from manufacturing variations that exist naturally within and across otherwise identical copies of a device. However, the levels of random variations that represent entropy, which are strongly correlated to the quality of the PUF-generated bitstrings, vary from one manufacturer to another. In this paper, we evaluate entropy across a set of devices manufactured by three mainstream FPGA vendors, Xilinx, Altera, and Microsemi. A delay-based PUF, called the SiRF PUF, is used in the evaluation and is constructed nearly identically across the three vendor devices. Our analysis includes an evaluation of actual path delay variation as it exists across the three device classes, as well as a statistical evaluation of the PUF-generated bitstrings. A reliability analysis is also provided using data collected in industrial-standard temperature experiments.</p>

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Statistical Quality Comparison of the Bitstrings Generated by a Physical Unclonable Function Across Xilinx, Altera, and Microsemi Devices

  • 期刊论文

  • 发表日期：

    2025年5月26日

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  • Jenilee Jao,
  • Jim Plusquellic,
  • Kristi Hoffman,
  • Brent Emery,
  • Cheryl Reid,
  • Ryan Thomson,
  • Michael Thompson

摘要

Entropy or randomness represents a foundational security property in security-related operations, such as key generation. Key generation in turn is central to security protocols such as authentication and encryption. Physical unclonable functions (PUF) are hardware-based primitives that can serve as key generation engines in modern microelectronic devices and applications. PUFs derive entropy from manufacturing variations that exist naturally within and across otherwise identical copies of a device. However, the levels of random variations that represent entropy, which are strongly correlated to the quality of the PUF-generated bitstrings, vary from one manufacturer to another. In this paper, we evaluate entropy across a set of devices manufactured by three mainstream FPGA vendors, Xilinx, Altera, and Microsemi. A delay-based PUF, called the SiRF PUF, is used in the evaluation and is constructed nearly identically across the three vendor devices. Our analysis includes an evaluation of actual path delay variation as it exists across the three device classes, as well as a statistical evaluation of the PUF-generated bitstrings. A reliability analysis is also provided using data collected in industrial-standard temperature experiments.