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<p>The collection efficiency of scintillation photons is a critical determinant of the overall energy resolution in the nEXO experiment. This study presents a systematic characterization of the vacuum ultraviolet (VUV) reflectance of the nEXO anode charge tile. The methodology combines specular reflectance measurements under vacuum, performed across a wavelength range of 120–250&#xa0;nm and incident angles of 7<InlineEquation ID="IEq1"> <EquationSource Format="TEX">\(^\circ \)</EquationSource> <EquationSource Format="MATHML"><math> <mmultiscripts> <mrow /> <mrow /> <mo>∘</mo> </mmultiscripts> </math></EquationSource> </InlineEquation>–51<InlineEquation ID="IEq2"> <EquationSource Format="TEX">\(^\circ \)</EquationSource> <EquationSource Format="MATHML"><math> <mmultiscripts> <mrow /> <mrow /> <mo>∘</mo> </mmultiscripts> </math></EquationSource> </InlineEquation>, with a multilayer theoretical model based on the Fresnel equations. At the 175&#xa0;nm scintillation wavelength of liquid xenon, the measured reflectance increases from 15.9 to 21.1% as the incident angle increases from 7<InlineEquation ID="IEq3"> <EquationSource Format="TEX">\(^\circ \)</EquationSource> <EquationSource Format="MATHML"><math> <mmultiscripts> <mrow /> <mrow /> <mo>∘</mo> </mmultiscripts> </math></EquationSource> </InlineEquation> to 51<InlineEquation ID="IEq4"> <EquationSource Format="TEX">\(^\circ \)</EquationSource> <EquationSource Format="MATHML"><math> <mmultiscripts> <mrow /> <mrow /> <mo>∘</mo> </mmultiscripts> </math></EquationSource> </InlineEquation>. A global fit of the experimental data was performed to optimize the optical constants of the gold (Au) film. The resulting theoretical model is in good agreement with the experimental data, providing a validated set of optical parameters that are crucial for accurately simulating and ultimately enhancing the light collection efficiency of the nEXO detector.</p>

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Optical constant determination for nEXO charge-readout tiles from VUV reflectance measurements

  • 期刊论文

  • 发表日期：

    2026年6月3日

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  • Xinlian Wu,
  • Xilei Sun,
  • Guoping Zuo,
  • Xiaomeng Wu,
  • Guofu Cao,
  • Cunding Liu,
  • Yuduo Guan

摘要

The collection efficiency of scintillation photons is a critical determinant of the overall energy resolution in the nEXO experiment. This study presents a systematic characterization of the vacuum ultraviolet (VUV) reflectance of the nEXO anode charge tile. The methodology combines specular reflectance measurements under vacuum, performed across a wavelength range of 120–250 nm and incident angles of 7 \(^\circ \) ∘ –51 \(^\circ \) ∘ , with a multilayer theoretical model based on the Fresnel equations. At the 175 nm scintillation wavelength of liquid xenon, the measured reflectance increases from 15.9 to 21.1% as the incident angle increases from 7 \(^\circ \) ∘ to 51 \(^\circ \) ∘ . A global fit of the experimental data was performed to optimize the optical constants of the gold (Au) film. The resulting theoretical model is in good agreement with the experimental data, providing a validated set of optical parameters that are crucial for accurately simulating and ultimately enhancing the light collection efficiency of the nEXO detector.