Simple gas ionization chamber design for low-energy ion measurements
摘要
With the recent advancements in accelerator mass spectrometry (AMS) technology, particularly in terms of compactness and low-energy capabilities, the accurate measurement of low-energy ions below 200 keV has become a crucial area of research.
MethodA novel single-anode gas ionization chamber (GIC) has been developed for low-energy ion counting in AMS. This innovative GIC consists of a 50-nm silicon nitride window, an anode, a Frisch grid, and a cathode. To optimize the measurement conditions and evaluate the detector's performance at low energies, test experiments were conducted using a 239Pu/241Am α source and 3H and 14C ions at the energies of ~ 180 keV.
ResultsThe experiments showed that the energy resolutions of α particles produced by 239Pu and 241Am decay were approximately 5%. For the testing of 3H and 14C ions at around 180 keV using the gas detector, the results indicate that the electronic noise is effectively distinguished from the low-energy ions that require measurement.
ConclusionThe new designed of GIC is specifically tailored for measuring ions at low energy, making it compliant with the stringent requirements for low-energy ion measurements at GXNU-AMS.