Study on X-ray and electron-excited fluorescence spectroscopy of tungsten using TES
摘要
In the exploration of celestial bodies, such as Mars, the Moon, and asteroids, X-ray fluorescence analysis has emerged as a critical tool for elemental analysis. However, the varying selection rules and excitation sources introduce complexity. Specifically, these discrepancies can cause variations in the intensities of the characteristic spectral lines emitted by identical elements. These variations, compounded by the minimal energy spacing between these spectral lines, pose substantial challenges for conventional silicon drift detectors (SDD), hindering their ability to accurately differentiate these lines and provide detailed insights into the material structure. To overcome this challenge, a cryogenic X-ray spectrometer based on transition-edge sensor (TES) detector arrays is required to achieve precise measurements. This study measured and analyzed the K-edge characteristic lines of copper and the diverse L-edge characteristic lines of tungsten using a comparative analysis of the electron and X-ray excitation processes. For the electron excitation experiments, copper and tungsten targets were employed as X-ray sources, as they emit distinctive X-ray spectra upon electron-beam bombardment. In the photon excitation experiments, a molybdenum target was used to produce a continuous spectrum with the prominent Mo K