OML: an online multi-particle locating method for high-resolution single-event effects studies

Identifying sensitive areas in integrated circuits susceptible to single-event effects (SEE) is crucial for improving radiation hardness. This study presents an online multi-track location (OML) framework to enhance the high-resolution online trajectory detection for the Hi’Beam-SEE system, which aims to localize SEE-sensitive positions on the IC at the micrometer scale and in real time. We employed a reparameterization method to accelerate the inference speed, merging the branches of the backbone of the location in the deployment scenario. Additionally, we designed an irregular convolution kernel, an attention mechanism, and a fused loss function to improve the positioning accuracy. OML demonstrates exceptional real-time processing capabilities, achieving a positioning accuracy of \({1.83}\,{\upmu \hbox {m}}\) $1.83\mathrm{\mu }\text{m}$ in processing data generated by the Hi’Beam-SEE system at 163 frames per second per GPU.