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Cable coupling response in metal cavity under X-ray irradiation

  • Mao-Xing Zhang,
  • Lan-Feng Yuan,
  • Cui Meng,
  • Yi-Nong Liu

摘要

This study investigates the coupling response of cables inside a metal cavity under X-ray irradiation using the finite-difference time-domain method, particle simulation method, and transmission-line equation to solve the electromagnetic field inside the cavity and load voltage at the cable terminal under X-ray excitation. The results show that under a strong ionizing radiation environment of \({1}\,{\hbox {J/cm}^{2}}\) 1 J/cm 2 , a strong electromagnetic environment is generated inside the cavity. The cable shielding layer terminal couples a voltage of 15.32 V, whereas the core wire terminal couples a voltage of 0.31 V. Under strong X-ray irradiation, the metal cavity not only fails to provide electromagnetic shielding, but also introduces new electromagnetic interference. This study also provides a method for reducing the number of emitted electrons by adding low-Z materials, which can effectively reduce the coupled electric field and voltage.