A seven-crystal spectrometer for high-energy resolution X-ray spectroscopy at Shanghai Synchrotron Radiation Facility

A Johann-type X-ray spectrometer was successfully developed at the hard X-ray branch (in-vacuum undulator with a 24-mm periodic length) of the energy material beamline (E-line) at the Shanghai Synchrotron Radiation Facility (SSRF). This spectrometer was utilized to implement X-ray emission spectroscopy (XES), high-energy resolution fluorescence-detected X-ray absorption spectroscopy (HERFD-XAS), and resonant inelastic X-ray scattering. Seven spherically bent crystals were positioned on the respective vertical 500-mm-diameter Rowland circles, adopting an area detector to increase the solid angle to 1.75 \(\%\) $\%$ of 4 \(\pi\) $\pi$ sr, facilitating the study of low-concentrate systems under complex reaction conditions. Operated under the atmosphere pressure, the spectrometer covers the energy region from 3.5 to 18 keV, with the Bragg angle ranging from 73 \(^{\circ }\) $_{}^{\circ }$ to 86 \(^{\circ }\) $_{}^{\circ }$ during vertical scanning. It offers a promised energy resolution of sub-eV (XES) and super-eV (HERFD-XAS). Generally, these comprehensive core-level spectroscopy methods based on hard X-rays at the E-line with an extremely high photon flux can meet the crucial requirements of a green energy strategy. Moreover, they provide substantial support for scientific advances in fundamental research.