Exploring the effect of Ba2+ ions doping on the dielectric properties of SrSnO3 ceramics
摘要
This study investigates the structural and dielectric properties of BaxSr1-xSnO3 (BSSO, x = 0, 0.2, 0.4, 0.6, 0.8) ceramics prepared by the solid-state reaction method. X-ray diffraction and X-ray photoelectron spectroscopy were used to characterize the phase purity and chemical state of the component elements, respectively. Frequency and temperature dependence of the dielectric properties suggest that the dielectric constant and loss are influenced by Ba2+ ions doping concentration, reaching an optimal dielectric performance at x = 0.4. The observed dielectric behavior can be explained by the interfacial polarization and dielectric relaxation processes, originated from the existing oxygen vacancies and Sn4+–Sn2+ pairs. These findings provide valuable insights into the potential applications of BaxSr1-xSnO3 ceramics in electronic devices.